產(chǎn)品介紹
產(chǎn)品名稱:表面沾污儀
品牌:Nuvia
產(chǎn)地:法國
型號:WIMP60M
表面沾污儀WIMP60M介紹:
- 為了檢查受控區(qū)域中使用的工具或測量儀器,以及檢查受控區(qū)域中的工作場所,通過擦拭測試計數(shù)儀WIMP進行測量。這些擦拭測試樣品在擦拭測試計數(shù)器中進行測量和評估。
- 表面沾污儀WIMP60M包括基于微處理器和 PC 的擦拭測試計數(shù)器,適用于 60 毫米直徑的樣品。
- 表面沾污儀WIMP60M與無氣體塑料閃爍探測器配合使用,這些探測器分別評估樣品(擦拭測試拭子、篩選測試或氣溶膠過濾器)的 α 和 β/γ 輻射。
- 表面沾污儀WIMP60M檢測限也根據(jù) ISO 11929 計算。
表面沾污儀WIMP60M參數(shù):
中文內(nèi)容來自機器翻譯,內(nèi)容僅供參考,實際內(nèi)容可參考原廠介紹或以合同為準。
英文原文:
WIMP
Single wipe test counters
To check tools or measuring instruments used in a controlled area, but also to check working places in a controlled area, measurements are made by means of wipe tests. These wipe test samples are measured and evaluated in wipe test counters.
Our product line consists of microprocessor- and PC- based wipe test counters for 60 mm, 120 mm or 220 mm diameter samples.
Our wipe test counters work with gas-free plastic- scintillation detectors which evaluate the samples (wipe test swabs, screening-tests or aerosol filters) separately for α- and β/γ-radiation.
Detection limits are also calculated according to ISO 11929.
WIMP 60
For up to 60 mm filter
diameter:
• WIMP 60 μC with
microcontroller electronics
• WIMP 60 PC with PC-based
measuring electronics
• WIMP 60 M as a mobile,
portable smear test counter
-
法國Nuvia小型伽馬射線光譜測量儀GAMS2
¥0.00
-
法國Nuvia伽馬射線光譜測量儀GAMS1
¥0.00
-
法國Nuvia個人劑量膠片0.02mSv–1.5Sv熱釋光劑量計
¥0.00
-
法國Nuvia熱釋光劑量計0.05mSv–5Sv個人劑量指環(huán)
¥0.00
-
法國Nuvia個人中子劑量探測儀0.2mSv–2Sv劑量計
¥0.00
-
法國Nuvia外部檢測器附件CoMo DolMo
¥0.00
-
法國Nuvia表面沾污儀WIMP擦拭測試計數(shù)儀
¥0.00
-
法國Nuvia表面沾污儀WIMP60M擦拭測試計數(shù)儀
¥0.00
-
法國Nuvia表面沾污儀WIMP120擦拭測試計數(shù)儀
¥0.00
-
法國Nuvia表面沾污儀WIMP220擦拭測試計數(shù)儀
¥0.00